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 ICX404AL
Diagonal 6mm (Type 1/3) CCD Image Sensor for EIA B/W Video Cameras
Description The ICX404AL is an interline CCD solid-state image sensor suitable for EIA B/W video cameras with a diagonal 6mm (Type 1/3) system. Compared with the conventional product ICX054BL, basic characteristics such as sensitivity, smear, dynamic range and S/N are improved drastically. This chip features a field period readout system and an electronic shutter with variable charge-storage time. This chip is suitable for applications such as surveillance cameras, automotive cameras, etc. 16 pin DIP (Plastic)
Features * High sensitivity (+4dB compared with the ICX054BL) * Low smear (-20dB compared with the ICX054BL) * High D range (+2dB compared with the ICX054BL) * High S/N * Low dark current * Excellent antiblooming characteristics * Continuous variable-speed shutter * No voltage adjustment (Reset gate and substrate bias are not adjusted.) * Reset gate: 5V drive * Horizontal register: 5V drive
Pin 1 1
V
12 2 Pin 9 H 25
Optical black position (Top View)
Device Structure * Interline CCD image sensor * Image size: Diagonal 6mm (Type 1/3) * Number of effective pixels: 510 (H) x 492 (V) approx. 250K pixels * Total number of pixels: 537 (H) x 505 (V) approx. 270K pixels * Chip size: 5.59mm (H) x 4.68mm (V) * Unit cell size: 9.6m (H) x 7.5m (V) * Optical black: Horizontal (H) direction : Front 2 pixels, rear 25 pixels Vertical (V) direction : Front 12 pixels, rear 1 pixel * Number of dummy bits: Horizontal 16 Vertical 1 (even fields only) * Substrate material: Silicon
Super HAD CCD is a trademark of Sony Corporation. The Super HAD CCD is a version of Sony's high performance CCD HAD (HoleAccumulation Diode) sensor with sharply improved sensitivity by the incorporation of a new semiconductor technology developed by Sony Corporation. Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits.
-1-
E00606B28
ICX404AL
Block Diagram and Pin Configuration (Top View)
VOUT
GND
V1
V3
2
8
7
6
5
V2
4
3
Vertical Register
Horizontal Register Note) : Photo sensor
9
10
11
12
13
14
15
16
GND
RG
SUB
H1
VL
NC
Pin Description Pin No. 1 2 3 4 5 6 7 8 Symbol V4 V3 V2 V1 GND NC NC VOUT Signal output Description
VDD
Pin No. 9 10 11 12 13 14 15 16
H2
V4
1 Note)
NC
NC
Symbol VDD GND SUB VL RG NC H1 H2
Description Supply voltage GND Substrate clock Protective transistor bias Reset gate clock
Vertical register transfer clock Vertical register transfer clock Vertical register transfer clock Vertical register transfer clock GND
Horizontal register transfer clock Horizontal register transfer clock
Absolute Maximum Ratings Item VDD, VOUT, RG - SUB Against SUB V1, V3 - SUB V2, V4, VL - SUB H1, H2, GND - SUB VDD, VOUT, RG - GND Against GND V1, V2, V3, V4 - GND H1, H2 - GND Against VL V1, V3 - VL V2, V4, H1, H2, GND - VL Voltage difference between vertical clock input pins Between input clock pins Storage temperature Operating temperature 1 +24V (Max.) when clock width < 10s, clock duty factor < 0.1%. -2- H1 - H2 H1, H2 - V4 Ratings -40 to +8 -50 to +15 -50 to +0.3 -40 to +0.3 -0.3 to +20 -10 to +18 -10 to +6 -0.3 to +28 -0.3 to +15 to +15 -6 to +6 -14 to +14 -30 to +80 -10 to +60 Unit V V V V V V V V V V V V C C 1 Remarks
ICX404AL
Bias Conditions Item Supply voltage Protective transistor bias Substrate clock Symbol VDD VL SUB Min. 14.55 Typ. 15.0 1 2 Max. 15.45 Unit V Remarks
1 VL setting is the VVL voltage of the vertical transfer clock waveform, or the same power supply as the VL power supply for the V driver should be used. 2 Do not apply a DC bias to the substrate clock pin, because a DC bias is generated within the CCD.
DC Characteristics Item Supply current Symbol IDD Min. Typ. 3 Max. 5 Unit mA Remarks
Clock Voltage Conditions Item Readout clock voltage Symbol VVT VVH1, VVH2 VVH3, VVH4 VVL1, VVL2, VVL3, VVL4 VV Vertical transfer clock voltage VVH3 - VVH VVH4 - VVH VVHH VVHL VVLH VVLL Horizontal transfer clock voltage VH VHL VRG Reset gate clock voltage VRGLH - VRGLL VRGL - VRGLm VRGH Substrate clock voltage VSUB VDD +0.3 21.0 VDD +0.6 22.0 4.75 -0.05 4.5 5.0 0 5.0 Min. 14.55 -0.05 -0.2 -8.0 6.3 -0.25 -0.25 Typ. 15.0 0 0 -7.0 7.0 Max. 15.45 0.05 0.05 -6.5 8.05 0.1 0.1 0.3 0.3 0.3 0.3 5.25 0.05 5.5 0.4 0.5 VDD +0.9 23.5 Unit V V V V V V V V V V V V V V V V V V Waveform diagram 1 2 2 2 2 2 2 2 2 2 2 3 3 4 4 4 4 5 Input through 0.1F capacitance Low-level coupling Low-level coupling High-level coupling High-level coupling Low-level coupling Low-level coupling VVL = (VVL3 + VVL4)/2 VV = VVHn - VVLn (n = 1 to 4) VVH = (VVH1 + VVH2)/2 Remarks
-3-
ICX404AL
Clock Equivalent Circuit Constant Item Capacitance between vertical transfer clock and GND Symbol CV1, CV3 CV2, CV4 CV12, CV34 Capacitance between vertical transfer clocks CV23, CV41 CV13 CV24 Capacitance between horizontal transfer clock and GND Capacitance between horizontal transfer clocks Capacitance between reset gate clock and GND Capacitance between substrate clock and GND Vertical transfer clock series resistor Vertical transfer clock ground resistor Horizontal transfer clock series resistor Reset gate clock series resistor
V1 CV12
Min.
Typ. 1500 1000 820 330 100 100 47 22 5 270 100 150 68 10 50
Max.
Unit pF pF pF pF pF pF pF pF pF pF
Remarks
CH1, CH2 CHH CRG CSUB R1, R3 R2, R4 RGND RH RRG
V2
R1
R2 RH H1 RH H2 CHH CV23 CV13 CH1 CH2
CV1 CV41 CV24
CV2
CV4 RGND CV3 R4 CV34 R3
V4
V3
Vertical transfer clock equivalent circuit
RRG RG
Horizontal transfer clock equivalent circuit
CRG
Reset gate clock equivalent circuit -4-
ICX404AL
Drive Clock Waveform Conditions (1) Readout clock waveform
100% 90%
II II
M M 2 tf 0V
VVT 10% 0% tr twh
(2) Vertical transfer clock waveform
V1 V3
VVH1
VVHH
VVH VVHL
VVHH VVHH VVHL VVHL VVH3 VVHH
VVH
VVHL
VVL1
VVLH
VVL3
VVLH
VVLL VVL VVL
VVLL
V2 VVHH VVHH
V4 VVHH VVHH
VVH VVHL
VVH
VVH2 VVHL
VVHL VVH4
VVHL
VVL2
VVLH
VVLH
VVLL VVL VVL4
VVLL VVL
VVH = (VVH1 + VVH2)/2 VVL = (VVL3 + VVL4)/2 VV = VVHn - VVLn (n = 1 to 4) -5-
ICX404AL
(3) Horizontal transfer clock waveform
tr twh tf
90%
VH 10% VHL
twl
(4) Reset gate clock waveform
tr twh tf VRGH twl
Point A RG waveform VRGLH VRGL VRGLL VRGLm H1 waveform VRG
10%
VRGLH is the maximum value and VRGLL is the minimum value of the coupling waveform during the period from Point A in the above diagram until the rising edge of RG. In addition, VRGL is the average value of VRGLH and VRGLL. VRGL = (VRGLH + VRGLL)/2 Assuming VRGH is the minimum value during the interval twh, then: VRG = VRGH - VRGL Negative overshoot level during the falling edge of RG is VRGLm. (5) Substrate clock waveform
100% 90%
M VSUB 10% 0% VSUB (A bias generated within the CCD) M 2 tf
tr
twh
-6-
ICX404AL
Clock Switching Characteristics Item Readout clock Vertical transfer clock Horizontal transfer clock During imaging Symbol VT V1, V2, V3, V4 H 37 41 5.6 5.6 11 15 75 79 38 42 12
0.012 0.012
twh
twl
tr
tf
Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. 2.3 2.5 0.5 15 0.5
Unit Remarks s During readout
250 ns 1 ns 2
15
10
0.012 0.012
15
During H1 parallel-serial conversion H2 RG SUB
s ns s During drain charge
Reset gate clock Substrate clock
6.5 0.5
4.5 0.5
1.5 2.0
1 When vertical transfer clock driver CXD1267AN is used. 2 tf tr - 2ns.
-7-
ICX404AL
Image Sensor Characteristics Item Sensitivity Saturation signal Smear Video signal shading Dark signal Dark signal shading Flicker Lag Symbol S Vsat Sm SH Vdt Vdt F Lag Min. 1080 1000 -115 -98 20 25 2 1 2 0.5 Typ. 1350 Max. Unit mV mV dB % % mV mV % % Measurement method 1 2 3 4 4 5 6 7 8
(Ta = 25C) Remarks
Ta = 60C
Zone 0 and I Zone 0 to II' Ta = 60C Ta = 60C
Zone Definition of Video Signal Shading
510 (H) 10 8 9 H 8 V 10 H 8
492 (V)
Zone 0, I Zone II, II' V 10
10
Ignored region Effective pixel region
-8-
ICX404AL
Image Sensor Characteristics Measurement Method Measurement conditions 1) In the following measurements, the device drive conditions are at the typical values of the bias and clock voltage conditions. 2) In the following measurements, spot blemishes are excluded and, unless otherwise specified, the optical black (OB) level is used as the reference for the signal output, and the value measured at point [A] in the drive circuit example is used. Definition of standard imaging conditions 1) Standard imaging condition I: Use a pattern box (luminance: 706cd/m2, color temperature of 3200K halogen source) as a subject. (Pattern for evaluation is not applicable.) Use a testing standard lens with CM500S (t = 1.0mm) as an IR cut filter and image at F8. The luminous intensity to the sensor receiving surface at this point is defined as the standard sensitivity testing luminous intensity. 2) Standard imaging condition II: Image a light source (color temperature of 3200K) with a uniformity of brightness within 2% at all angles. Use a testing standard lens with CM500S (t = 1.0mm) as an IR cut filter. The luminous intensity is adjusted to the value indicated in each testing item by the lens diaphragm. 1. Sensitivity Set to standard imaging condition I. After selecting the electronic shutter mode with a shutter speed of 1/250s, measure the signal output (Vs) at the center of the screen and substitute the value into the following formula. S = Vs x 250 60
[mV]
2. Saturation signal Set to standard imaging condition II. After adjusting the luminous intensity to 10 times the intensity with the average value of the signal output, 200mV, measure the minimum value of the signal output. 3. Smear Set to standard imaging condition II. With the lens diaphragm at F5.6 to F8, adjust the luminous intensity to 500 times the intensity with average value of the signal output, 200mV. When the readout clock is stopped and the charge drain is executed by the electronic shutter at the respective H blankings, measure the maximum value YSm [mV] of the signal output and substitute the value into the following formula. Sm = 20 x log 1 VSm 1 x x 10 200 500 [dB] (1/10V method conversion value)
-9-
ICX404AL
4. Video signal shading Set to standard imaging condition II. With the lens diaphragm at F5.6 to F8, adjust the luminous intensity so that the average value of the signal output is 200mV. Then measure the maximum (Vmax [mV]) and minimum (Vmin [mV]) values of the signal output and substitute the values into the following formula. SH = (Vmax - Vmin)/200 x 100 [%] 5. Dark signal Measure the average value of the signal output (Vdt [mV]) with the device ambient temperature 60C and the device in the light-obstructed state, using the horizontal idle transfer level as a reference. 6. Dark signal shading After measuring 5, measure the maximum (Vdmax [mV]) and minimum (Vdmin [mV]) values of the dark signal output and substitute the values into the following formula. Vdt = Vdmax - Vdmin [mV] 7. Flicker Set to standard imaging condition II. Adjust the luminous intensity so that the average value of the signal output is 200mV, and then measure the difference in the signal level between fields (Vf [mV]). Then substitute the value into the following formula. F = (Vf/200) x 100 [%] 8. Lag Adjust the signal output value generated by strobe light to 200mV. After setting the strobe light so that it strobes with the following timing, measure the residual signal (Vlag). Substitute the value into the following formula. Lag = (Vlag/200) x 100 [%]
FLD
V1
Light Strobe light timing Y signal output 200mV Output Ylag (lag)
- 10 -
Drive Circuit
15V 20 100k 19 18 17 16 CXD1267AN 15 3.3/16V 22/16V 14 13 12 11 1/35V 0.1 -7.0V
1
2
3
XSUB
4
XV2
5
XV1
6
XSG1
7
XV3
8
XSG2
9
10
XV4
22/20V
V4
V3
V2
V1
NC
NC
GND
VOUT
H1
RG
H2
NC
VL
GND
16 15 14 13 12 11 10
SUB
9 1500p 0.01 1M
H2
H1 3.3/20V
100k
1/20V 0.1
RG
VDD
- 11 -
1 2 3 4 5 6 7 8 ICX404 (BOTTOM VIEW)
100 2SK523 3.9k
[A] CCD OUT
ICX404AL
ICX404AL
Spectral Sensitivity Characteristics (excludes both lens characteristics and light source characteristics)
1.0 0.9 0.8 0.7
Relative Response
0.6 0.5 0.4 0.3 0.2 0.1 0 400 500 600 700 Wave Length [nm] 800 900 1000
Sensor Readout Clock Timing Chart
V1 V2 Odd Field V3 V4 31.3 0.3
2.5
1.2 1.5 2.5 2.0
V1 V2 Even Field V3 V4 Unit : s
- 12 -
Drive Timing Chart (Vertical Sync)
FLD
VD
BLK
HD
10
15
20
260
520
265
525 1 2 3 4 5
270
275
- 13 -
246 135 246 135 492 491
V1
V2
V3
V4
CCD OUT
492 491
246 135
246 135
280
ICX404AL
Drive Timing Chart (Horizontal Sync)
HD
BLK
H1
5 1 2 3 5 15 10 20 25 10 15 16 1 2 1 2 3 10
H2
- 14 -
RG
V1
V2
V3
V4
SUB
500
505
510 1 2 3
5
ICX404AL
ICX404AL
Notes on Handling 1) Static charge prevention CCD image sensors are easily damaged by static discharge. Before handling be sure to take the following protective measures. a) Either handle bare handed or use non-chargeable gloves, clothes or material. Also use conductive shoes. b) When handling directly use an earth band. c) Install a conductive mat on the floor or working table to prevent the generation of static electricity. d) Ionized air is recommended for discharge when handling CCD image sensor. e) For the shipment of mounted substrates, use boxes treated for the prevention of static charges. 2) Soldering a) Make sure the package temperature does not exceed 80C. b) Solder dipping in a mounting furnace causes damage to the glass and other defects. Use a ground 30W soldering iron and solder each pin in less than 2 seconds. For repairs and remount, cool sufficiently. c) To dismount an image sensor, do not use a solder suction equipment. When using an electric desoldering tool, use a thermal controller of the zero cross On/Off type and connect it to ground. 3) Dust and dirt protection Image sensors are packed and delivered by taking care of protecting its glass plates from harmful dust and dirt. Clean glass plates with the following operation as required, and use them. a) Perform all assembly operations in a clean room (class 1000 or less). b) Do not either touch glass plates by hand or have any object come in contact with glass surfaces. Should dirt stick to a glass surface, blow it off with an air blower. (For dirt stuck through static electricity ionized air is recommended.) c) Clean with a cotton bud and ethyl alcohol if the grease stained. Be careful not to scratch the glass. d) Keep in a case to protect from dust and dirt. To prevent dew condensation, preheat or precool when moving to a room with great temperature differences. e) When a protective tape is applied before shipping, just before use remove the tape applied for electrostatic protection. Do not reuse the tape. 4) Installing (attaching) a) Remain within the following limits when applying a static load to the package. Do not apply any load more than 0.7mm inside the outer perimeter of the glass portion, and do not apply any load or impact to limited portions. (This may cause cracks in the package.)
Cover glass
50N Plastic package Compressive strength
50N
1.2Nm Torsional strength
- 15 -
ICX404AL
b) If a load is applied to the entire surface by a hard component, bending stress may be generated and the package may fracture, etc., depending on the flatness of the bottom of the package. Therefore, for installation, use either an elastic load, such as a spring plate, or an adhesive. c) The adhesive may cause the marking on the rear surface to disappear, especially in case the regulated voltage value is indicated on the rear surface. Therefore, the adhesive should not be applied to this area, and indicated values should be transferred to the other locations as a precaution. d) The notch of the package is used for directional index, and that can not be used for reference of fixing. In addition, the cover glass and seal resin may overlap with the notch of the package. e) If the lead bend repeatedly and the metal, etc., clash or rub against the package, the dust may be generated by the fragments of resin. f) Acrylate anaerobic adhesives are generally used to attach CCD image sensors. In addition, cyanoacrylate instantaneous adhesives are sometimes used jointly with acrylate anaerobic adhesives. (reference) 5) Others a) Do not expose to strong light (sun rays) for long periods. For continuous using under cruel condition exceeding the normal using condition, consult our company. b) Exposure to high temperature or humidity will affect the characteristics. Accordingly avoid storage or usage in such conditions. c) The brown stain may be seen on the bottom or side of the package. But this does not affect the CCD characteristics. d) This package has 2 kinds of internal structure. However, their package outline, optical size, and strength are the same.
Structure A Package Chip Metal plate (lead frame)
Structure B
Cross section of lead frame
The cross section of lead frame can be seen on the side of the package for structure A.
- 16 -
Package Outline
Unit: mm
16 pin DIP (450mil)
A
0 to 9
6.1 9 16
D
~
2.5
C
11.43
8.4
5.7
V H 10.3 12.2 0.1 B' 2-R0.5
~
2.5
9.5 11.4 0.1
0.5
1.2
3.35 0.15
9.2 1. "A" is the center of the effective image area.
2.5
0.3
M
1.27 3.5 0.3
- 17 -
3.1
~
2. The two points "B" of the package are the horizontal reference. The point "B'" of the package is the vertical reference. 3. The bottom "C" of the package, and the top of the cover glass "D" are the height reference. 4. The center of the effective image area relative to "B" and "B'" is (H, V) = (6.1, 5.7) 0.15mm. 5. The rotation angle of the effective image area relative to H and V is 1. 6. The height from the bottom "C" to the effective image area is 1.41 0.10mm. The height from the top of the cover glass "D" to the effective image area is 1.94 0.15mm. 7. The tilt of the effective image area relative to the bottom "C" is less than 50m. The tilt of the effective image area relative to the top "D" of the cover glass is less than 50m. 8. The thickness of the cover glass is 0.75mm, and the refractive index is 1.5. 9. The notches on the bottom of the package are used only for directional index, they must not be used for reference of fixing.
ICX404AL
0.69 1.27 0.46
0.3
(For the first pin only)
PACKAGE STRUCTURE
PACKAGE MATERIAL
Plastic
LEAD TREATMENT
GOLD PLATING
LEAD MATERIAL
42 ALLOY
PACKAGE MASS
0.90g
Sony Corporation
DRAWING NUMBER
AS-C2.2-01(E)
0.25
1.2 11.6
8 1
2.5
B


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